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Test plans can be of various types depending on the form of acceptance and rejection boundaries. The PC-program and test plans Catalogue describe four types of test plans: Truncated Sequential, New types 1 and 2, Time/Failure.
| 1. Truncated sequential test plan (T/S)
The figure shows the controlling characteristics for a truncated sequential test plan (A,B,R, Tmax).
This type of test plan assures high test efficiency.
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| 2. Test plan of a new type (New1)
The figure shows the controlling characteristics for a test plan of a type New1 (A,B,R). The characteristic B causes a gradual change of the acceptance boundary and doesn’t have a graphic analogue.
This type of test plan most often assures the highest test efficiency.
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| 3. Test plan of a new type (New2)
The figure shows the controlling characteristics for a test plan of type New2 (A,B,R).
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| 4. Time/Failure test plan (T/F)
The figure shows the controlling characteristics for a test plan of Time/Failure type (A and R).
This type of test plan is inaccurate and less efficient.
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